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Dresden University of Technology
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Electronic Design

 

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 rothe

Dipl.-Ing. Susann Rothe
 PhD Student

German  

 

 

Research:
 

 

Publications:

  • S. Rothe, J. Lienig: Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines, Accepted for publication at the International Symposium on Physical Design (ISPD), 2023

  • S. Rothe, J. Lienig: Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects, [pdf, IEEEXplore] In Proc. Symposium on Integrated Circuits and Systems Design (SBCCI), August 2022, Brazil

  • J. Lienig, S. Rothe, M. Thiele, N. Rangarajan, M. Nabeel, H. Amrouch, O. Sinanoglu, and J. Knechtel: Toward security closure in the face of reliability effects, [pdf, IEEEXplore] in Proc. IEEE/ACM Int. Conf. Comput.-Aided Des. (ICCAD), Special Session, 2021

  • Diploma Thesis, TU Dresden
    Development of a Routing Library for Electromigration-Robust Layout Design,
    Sept. 2021

  • Student Research Project, TU Dresden
    Conceptional Design of a Tool for Automatic Translation of Design Rule Formats,
    Aug. 2020

 

Contact:

 

Phone +49 351 463 3 54 17
Fax +49 351 463 3 71 83
E-Mail susann.rothemailbox.tu-dresden.de
ORCID https://orcid.org/0000-0002-7238-1506
Letters TU Dresden
  Institut für Feinwerktechnik und Elektronik-Design
  D-01062 Dresden
Office Barkhausenbau
  Helmholtzstraße 18
  Room II/30

 

  Impressum

Last update: 28/11/2022