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Dipl.-Ing. Susann
Rothe
PhD Student
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German
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S. Rothe, J. Lienig:
Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines,
[pdf,
DOI] in Proc. of the ACM 2023 Int. Symposium on Physical Design (ISPD'23), Virtual Event, March 2023.
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S. Rothe, J. Lienig:
Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects, [pdf, IEEEXplore]
In Proc. Symposium on Integrated Circuits and Systems Design (SBCCI), August 2022, Brazil
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J. Lienig, S. Rothe, M. Thiele, N. Rangarajan, M. Nabeel, H. Amrouch, O. Sinanoglu, and J. Knechtel:
Toward security closure in the face of reliability effects, [pdf, IEEEXplore] in Proc. IEEE/ACM Int. Conf. Comput.-Aided Des. (ICCAD), Special Session, 2021
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Diploma Thesis, TU Dresden
Development of a Routing Library for Electromigration-Robust Layout Design, Sept. 2021
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Student Research Project, TU Dresden
Conceptional Design of a Tool for Automatic Translation of Design Rule Formats, Aug. 2020
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Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines, [slides] 17th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP), April 2023, Bad Schandau
Phone |
+49
351 463 3 54 17 |
Fax |
+49
351 463 3 71 83 |
E-Mail |
susann.rothe mailbox.tu-dresden.de |
ORCID |
https://orcid.org/0000-0002-7238-1506 |
Letters |
TU
Dresden |
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Institut
für Feinwerktechnik und Elektronik-Design |
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D-01062
Dresden |
Office |
Barkhausenbau |
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Helmholtzstraße
18 |
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Room
II/30 |
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