Fundamentals of
Electromigration-Aware Integrated Circuit Design
ISBN
978-3-319-73557-3,
eBook ISBN 978-3-319-73558-0 |
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Please email jens.lienig ifte.de if you find any errors.
Following the convention that compressive stress is defined as negative and tensile stress as positive, the following changes are required:
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Impressum | ||
Last update: 02.02.2022 |