@InProceedings{2017_Thiele_VLSI_SoC,
author = {M. Thiele and S. Bigalke and J. Lienig},
title = {Exploring the use of the finite element method for electromigration analysis in future physical design},
booktitle = {Proc. of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)},
year = {2017},
pages = {1--6},
month = {Oct.},
doi = {10.1109/VLSI-SoC.2017.8203466},
}